[dpdk-dev] [PATCH v2 0/4] eal/common: introduce rte_memset and related test

Yang, Zhiyong zhiyong.yang at intel.com
Thu Jan 19 02:36:18 CET 2017


> -----Original Message-----
> From: Thomas Monjalon [mailto:thomas.monjalon at 6wind.com]
> Sent: Wednesday, January 18, 2017 3:43 PM
> To: Yang, Zhiyong <zhiyong.yang at intel.com>
> Cc: Richardson, Bruce <bruce.richardson at intel.com>; Ananyev, Konstantin
> <konstantin.ananyev at intel.com>; yuanhan.liu at linux.intel.com; De Lara
> Guarch, Pablo <pablo.de.lara.guarch at intel.com>; dev at dpdk.org
> Subject: Re: [dpdk-dev] [PATCH v2 0/4] eal/common: introduce rte_memset
> and related test
> 
> 2017-01-18 02:42, Yang, Zhiyong:
> > From: Thomas Monjalon [mailto:thomas.monjalon at 6wind.com]
> > > The functional autotest is not integrated in the basic test suite.
> >
> > I can run command line "memset_autotest",  It seems that I leave
> something out.
> 
> Please check app/test/autotest_data.py

Thanks, Thomas.


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