[dpdk-dev] [PATCH v2] test: Fix memory corruption issues which fails the link_bonding test.
Ferruh Yigit
ferruh.yigit at intel.com
Tue Jul 18 18:13:54 CEST 2017
On 7/10/2017 12:13 PM, Herbert Guan wrote:
> Patch V2: fix build warnings by deleting unused variables.
>
> There were double-free problems in some test cases, which will cause
> a duplicated mbuf will be added into mempool. After double-free,
> some new allocated mbuf will hold a same address and thus cause the
> memory corruption.
>
> Another minor issue is that in some test cases, allocated mbuf will
> not be released after test case exits. Hopefully these leaked mbuf
> will be released by the next test case in its setup phase when
> stopping the virtual pmd ports, while this do is a memory leak of
> the exited test case.
>
> To fix above 2 issues, this patch will do:
> 1) Release virtual pmd ports' tx queue in the clean up function
> remove_slaves_and_stop_bonded_device() of each test cases.
> 2) Do not release allocated mbufs for test bursts. These mbufs
> will be released in remove_slaves_and_stop_bonded_device() when
> test case exits.
>
> Signed-off-by: Herbert Guan <herbert.guan at arm.com>
Updated unit test causing segfault, before and after patch, am I doing
something wrong?
I will postpone this patch until unit test can be verified.
Thanks,
ferruh
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