[dpdk-dev] [PATCH v6 2/2] test/test: add unit test for CRC computation
De Lara Guarch, Pablo
pablo.de.lara.guarch at intel.com
Wed Mar 29 18:12:55 CEST 2017
Hi Jasvinder,
> -----Original Message-----
> From: Singh, Jasvinder
> Sent: Wednesday, March 29, 2017 1:42 PM
> To: dev at dpdk.org
> Cc: olivier.matz at 6wind.com; Doherty, Declan; De Lara Guarch, Pablo
> Subject: [PATCH v6 2/2] test/test: add unit test for CRC computation
>
> This patch provides a set of tests for verifying the functional
> correctness of 16-bit and 32-bit CRC APIs.
>
> Signed-off-by: Jasvinder Singh <jasvinder.singh at intel.com>
> ---
> test/test/Makefile | 2 +
> test/test/test_crc.c | 241
> +++++++++++++++++++++++++++++++++++++++++++++++++++
> 2 files changed, 243 insertions(+)
> create mode 100644 test/test/test_crc.c
>
...
> diff --git a/test/test/test_crc.c b/test/test/test_crc.c
> new file mode 100644
> index 0000000..c25790d
> --- /dev/null
> +++ b/test/test/test_crc.c
> @@ -0,0 +1,241 @@
...
> +static int
> +test_crc_scalar(void)
Could you merge this and the next function in a single one,
as they are duplicated (except for the comments/printfs, which can be a parameter of the function).
Apart from this:
Acked-by: Pablo de Lara <pablo.de.lara.guarch at intel.com>
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