[dpdk-test-report] |ERROR| pw 8306-8307 [dpdk-dev, v4, 2/2] app/testpmd: add test commands for selecting different GRE key sizes

[sys_stv at intel.com]

Test-Status: Malformed patch

Submitter: Helin Zhang <helin.zhang at intel.com>
Date: Fri, 30 Oct 2015 12:54:20 +0800

DPDK git baseline: affc455438f4cbd3b14e2d9a24fbc154e22d68d3

Malformed PatchworkID: 
http://www.dpdk.org/dev/patchwork/patch/8306/
Error: patching file doc/guides/rel_notes/release_2_2.rst
Hunk #1 succeeded at 43 with fuzz 2 (offset 10 lines).
patching file drivers/net/i40e/i40e_ethdev.c
Hunk #1 succeeded at 5199 (offset -140 lines).
Hunk #2 succeeded at 5231 (offset -140 lines).
Hunk #3 succeeded at 5324 (offset -140 lines).
Hunk #4 succeeded at 5717 (offset -746 lines).
patching file lib/librte_ether/rte_eth_ctrl.h
Hunk #1 FAILED at 295.
1 out of 1 hunk FAILED -- saving rejects to file lib/librte_ether/rte_eth_ctrl.h.rej

http://www.dpdk.org/dev/patchwork/patch/8307/
Error: patching file app/test-pmd/cmdline.c
Hunk #1 succeeded at 6623 (offset -22 lines).
Hunk #2 succeeded at 9059 (offset -476 lines).
patching file doc/guides/testpmd_app_ug/testpmd_funcs.rst
Hunk #1 FAILED at 1810.
1 out of 1 hunk FAILED -- saving rejects to file doc/guides/testpmd_app_ug/testpmd_funcs.rst.rej



DPDK STV team