[dpdk-test-report] |SUCCESS| pw27525 [PATCH] eal: bus scan and probe never fail

checkpatch at dpdk.org checkpatch at dpdk.org
Sat Aug 12 12:14:05 CEST 2017

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Test-Label: checkpatch
Test-Status: SUCCESS
http://dpdk.org/patch/27525

_coding style OK_

Previous message: [dpdk-test-report] |SUCCESS| pw27524 [PATCH] kni: fix SLE version detection
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