[dpdk-test-report] |FAILURE| pw65615[v2] app/test: add test for mbuf with pinned external buffer

[sys_stv at intel.com]

Test-Label: Intel-compilation
Test-Status: FAILURE
http://dpdk.org/patch/65615

_apply issues_

Submitter: Viacheslav Ovsiienko <viacheslavo at mellanox.com>
Date: 2020-02-06 09:49:20
Reply_mail: 1580982560-4457-1-git-send-email-viacheslavo at mellanox.com
DPDK git baseline:
	Repo:dpdk, CommitID: 0e157d7a9a0d36d88da9315d018262492b0a64aa

*Repo: dpdk
testclone_testupdate_testdetach(struct rte_mempool *pktmbuf_pool)
{
	struct rte_mbuf *m = NULL;
	struct rte_mbuf *clone = NULL;

error: patch failed: app/test/test_mbuf.c:310
error: app/test/test_mbuf.c: patch does not apply

DPDK STV team