[v4,2/3] test/efd: enable unit test compilation always
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Commit Message
This patch enables compilation of print_key_info() always using
log-level based approach instead of a macro. Need to set efd log type
to debug to print debug information, using the following eal parameter:
--log-level=test.efd:debug
Suggested-by: Thomas Monjalon <thomas@monjalon.net>
Signed-off-by: Dharmik Thakkar <dharmik.thakkar@arm.com>
Reviewed-by: Honnappa Nagarahalli <honnappa.nagarahalli@arm.com>
Reviewed-by: Gavin Hu <gavin.hu@arm.com>
Reviewed-by: Phil Yang <phil.yang@arm.com>
Reviewed-by: Ferruh Yigit <ferruh.yigit@intel.com>
---
v4:
* change to dynamic logging (Stephen Hemminger)
---
v3:
* Resolve coding style issues
---
v2:
* Add Reviewed-by tag
---
test/test/test_efd.c | 24 +++++++++++-------------
1 file changed, 11 insertions(+), 13 deletions(-)
@@ -31,31 +31,29 @@ struct flow_key {
uint16_t port_dst;
uint8_t proto;
} __attribute__((packed));
+
+int efd_logtype_test;
+
+RTE_INIT(test_efd_init_log)
+{
+ efd_logtype_test = rte_log_register("test.efd");
+}
+
/*
* Print out result of unit test efd operation.
*/
-#if defined(UNIT_TEST_EFD_VERBOSE)
-
static void print_key_info(const char *msg, const struct flow_key *key,
efd_value_t val)
{
const uint8_t *p = (const uint8_t *) key;
unsigned int i;
- printf("%s key:0x", msg);
+ rte_log(RTE_LOG_DEBUG, efd_logtype_test, "%s key:0x", msg);
for (i = 0; i < sizeof(struct flow_key); i++)
- printf("%02X", p[i]);
+ rte_log(RTE_LOG_DEBUG, efd_logtype_test, "%02X", p[i]);
- printf(" @ val %d\n", val);
+ rte_log(RTE_LOG_DEBUG, efd_logtype_test, " @ val %d\n", val);
}
-#else
-
-static void print_key_info(__attribute__((unused)) const char *msg,
- __attribute__((unused)) const struct flow_key *key,
- __attribute__((unused)) efd_value_t val)
-{
-}
-#endif
/* Keys used by unit test functions */
static struct flow_key keys[5] = {