Bug 1427 - BPF jit test errors on Arm
Summary: BPF jit test errors on Arm
Status: UNCONFIRMED
Alias: None
Product: DPDK
Classification: Unclassified
Component: core (show other bugs)
Version: 24.03
Hardware: ARM All
: Normal normal
Target Milestone: ---
Assignee: dev
URL:
Depends on:
Blocks:
 
Reported: 2024-04-30 20:04 CEST by Stephen Hemminger
Modified: 2024-04-30 20:04 CEST (History)
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Description Stephen Hemminger 2024-04-30 20:04:27 CEST 
In test log, saw these errors in BPF JIT when running bpf_convert_autotest.
Looks like bug in ARM JIT that is being silently ignored.

EAL: Detected CPU lcores: 32
EAL: Detected NUMA nodes: 1
EAL: Detected static linkage of DPDK
EAL: Multi-process socket /var/run/dpdk/rte/mp_socket
EAL: Selected IOVA mode 'VA'
EAL: Probe PCI driver: net_virtio (1af4:1041) device: 0000:01:00.0 (socket -1)
eth_virtio_pci_init(): Failed to init PCI device
EAL: Requested device 0000:01:00.0 cannot be used
APP: HPET is not enabled, using TSC as default timer
BPF: bpf_exec(0xffff87fc2000): division by 0 at pc: 0x68;
BPF: emit(0xffff87fc2000): invalid opcode 0x30 at pc: 1;
BPF: __rte_bpf_jit(0xffff87fc2000) failed, error code: -22;
BPF: emit(0xffff87fc2000): invalid opcode 0x30 at pc: 1;
BPF: __rte_bpf_jit(0xffff87fc2000) failed, error code: -22;
BPF: emit(0xffff87fc2000): invalid opcode 0x30 at pc: 1;
BPF: __rte_bpf_jit(0xffff87fc2000) failed, error code: -22;
-------

  9/111 DPDK:fast-tests / bpf_convert_autotest  OK       0.28 s
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